Phone400-615-4535 E-mailinfo@tiaoovon.com

技術支持 Technologies

橢偏儀技術

發布者:眺望科技                     發布日期:2018-03-30

he FS-1 uses the power of ellipsometry to optically characterize samples.  In an ellipsometer system, the Polarization State Generator (PSG) emits light with a known polarization, which is obliquely incident on the sample, and the Polarization State Detector (PSD) measures the polarization state of the light reflected from the sample.

1.jpg

The change in polarization state caused by the sample reflection can be defined by the ratio of the sample reflectivity for p-polarized light (Rp), over the sample reflectivity for s-polarized light (Rs).  This ratio is a complex number, which is typically denoted by ρ (rho), and is often reported in terms of the ellipsometric parameters Ψ (Psi) and Δ (Delta), as defined by the following equation.  According to this equation, tan(Ψ) defines the magnitude of the reflectivity ratio for p- and s- polarized light, and Δ defines the phase difference between the reflected p- and s- polarized light.

2.jpg

An alternate representation of the ellipsometric parameters is shown below. The N, C, and S ellipsometric parameters can be calculated in terms of the Ψ (Psi) and Δ (Delta) parameters, assuming the sample is isotropic and non-depolarizing. One of the advantages of the N,C,S representation of the ellipsometric parameters is that if the sample is depolarizing, the degree of polarization P can also be reported.

3.jpg

The ellipsometric parameters measured on the sample (and reported in either the Ψ/Δ or N,C,S representation) can be further analyzed to determine sample properties of interest, such as film thicknesses and optical constants.

 

400-615-4535
400-615-4535
上海快3开奖l结果查询 欢乐麻将开挂的太多 微信红包麻将下载安装 河北11选5一定牛 浙体育彩票6十1开奖号 一码中大公开你敢买吗 六彩开奖结果直播现场 江西赣州麻将怎么打 百家乐网络 陕西快乐十分规律 海南麻将什么叫有番 赚q币 pc蛋蛋除外 超精准一尾中特高手 白板财神杭州麻将规则 独行侠vs湖人 二四六精选免费大全 不联网手机版免费单机打麻将